• 文献标题:   Enhanced Carrier Transport along Edges of Graphene Devices
  • 文献类型:   Article
  • 作  者:   CHAE J, JUNG SY, WOO S, BAEK H, HA J, SONG YJ, SON YW, ZHITENEV NB, STROSCIO JA, KUK Y
  • 作者关键词:   graphene, edge, edge state, scanning gate microscopy
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984
  • 通讯作者地址:   Seoul Natl Univ
  • 被引频次:   24
  • DOI:   10.1021/nl2041222
  • 出版年:   2012

▎ 摘  要

The relation between macroscopic charge transport properties and microscopic carrier distribution is one of the central issues in the physics and future applications of graphene devices (GDs). We find strong conductance enhancement at the edges of GDs using scanning gate microscopy. This result is explained by our theoretical model of the opening of an additional conduction channel localized at the edges by depleting accumulated charge by the tip.