• 文献标题:   Measuring the complex admittance of a nearly isolated graphene quantum
  • 文献类型:   Article
  • 作  者:   ZHANG ML, WEI D, DENG GW, LI SX, LI HO, CAO G, TU T, XIAO M, GUO GC, JIANG HW, GUO GP
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Sci Technol China
  • 被引频次:   10
  • DOI:   10.1063/1.4893883
  • 出版年:   2014

▎ 摘  要

We measured the radio-frequency reflection spectrum of an on-chip reflection line resonator coupled to a graphene double quantum dot (DQD), which was etched almost isolated from the reservoir and reached the low tunnel rate region. The charge stability diagram of DQD was investigated via dispersive phase and magnitude shift of the resonator with a high quality factor. Its complex admittance and low tunnel rate to the reservoir was also determined from the reflected signal of the on-chip resonator. Our method may provide a non-invasive and sensitive way of charge state readout in isolated quantum dots. (C) 2014 AIP Publishing LLC.