• 文献标题:   Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy Studies of Graphene Films Prepared by Sonication-Assisted Dispersion
  • 文献类型:   Article
  • 作  者:   POLYAKOVA EY, RIM KT, EOM D, DOUGLASS K, OPILA RL, HEINZ TF, TEPLYAKOV AV, FLYNN GW
  • 作者关键词:   graphene, sonicationassisted dispersion, scanning tunneling microscopy, xray photoelectron spectroscopy
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Graphene Labs Inc
  • 被引频次:   36
  • DOI:   10.1021/nn1009352
  • 出版年:   2011

▎ 摘  要

We describe scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films produced by sonication-assisted dispersion. Defects In these samples are not randomly distributed, and the graphene films exhibit a "patchwork" structure where unperturbed graphene areas are adjacent to heavily functionalized ones. Adjacent graphene layers are likely in poor mechanical contact due to adventitious species trapped between the carbon sheets of the sample.