• 文献标题:   Pinpoint operando analysis of the electronic states of a graphene transistor using photoelectron nanospectroscopy
  • 文献类型:   Article
  • 作  者:   FUKIDOME H, NAGASHIO K, NAGAMURA N, TASHIMA K, FUNAKUBO K, HORIBA K, SUEMITSU M, TORIUMI A, OSHIMA M
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS EXPRESS
  • ISSN:   1882-0778 EI 1882-0786
  • 通讯作者地址:   Tohoku Univ
  • 被引频次:   5
  • DOI:   10.7567/APEX.7.065101
  • 出版年:   2014

▎ 摘  要

Graphene is a promising material for next-generation devices owing to its excellent electronic properties. Graphene devices do not, however, exhibit the high performance that is expected considering graphene's intrinsic electronic properties. Operando, i.e., gate-controlled, photoelectron nanospectroscopy is needed to observe electronic states in device operation conditions. We have achieved, for the first time, pinpoint operando core-level photoelectron nanospectroscopy of a channel of a graphene transistor. The direct relationship between the graphene's binding energy and the Fermi level is reproduced by a simulation assuming linear band dispersion. This operando nanospectroscopy will bridge the gap between electronic properties and device performance. (C) 2014 The Japan Society of Applied Physics