• 文献标题:   Wafer scale BN on sapphire substrates for improved graphene transport
  • 文献类型:   Article
  • 作  者:   VANGALA S, SIEGEL G, PRUSNICK T, SNURE M
  • 作者关键词:  
  • 出版物名称:   SCIENTIFIC REPORTS
  • ISSN:   2045-2322
  • 通讯作者地址:   Air Force Res Lab
  • 被引频次:   6
  • DOI:   10.1038/s41598-018-27237-z
  • 出版年:   2018

▎ 摘  要

Wafer scale (2 '') BN grown by metal organic chemical vapor deposition (MOCVD) on sapphire was examined as a weakly interacting dielectric substrate for graphene, demonstrating improved transport properties over conventional sapphire and SiO2/Si substrates. Chemical vapor deposition grown graphene was transferred to BN/sapphire substrates for evaluation of more than 30 samples using Raman and Hall effects measurements. A more than 2x increase in Hall mobility and 10x reduction in sheet carrier density was measured for graphene on BN/sapphire compared to sapphire substrates. Through control of the MOCVD process, BN films with roughness ranging from <0.1 nm to >1 nm were grown and used to study the effects of substrate roughness on graphene transport. Arrays of graphene field effect transistors were fabricated on 2 '' BN/sapphire substrates demonstrating scalability and device performance enhancement.