• 文献标题:   A visualization method for probing grain boundaries of single layer graphene via molecular beam epitaxy
  • 文献类型:   Article
  • 作  者:   ZHAN LJ, WAN W, ZHU ZW, ZHAO ZJ, ZHANG ZH, SHIH TM, CAI WW
  • 作者关键词:   grain boundary, direct visualization, molecular beam epitaxy
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:   Xiamen Univ
  • 被引频次:   2
  • DOI:   10.1088/1361-6528/aa77ec
  • 出版年:   2017

▎ 摘  要

Graphene, a member of layered two-dimensional (2D) materials, possesses high carrier mobility, mechanical flexibility, and optical transparency, as well as enjoying a wide range of promising applications in electronics. Adopting the chemical vaporization deposition method, the majority of investigators have ubiquitously grown single layer graphene (SLG), which inevitably involves polycrystalline properties. Here we demonstrate a simple method for the direct visualization of arbitrarily large-size SLG domains by synthesizing one-hundred-nm-scale MoS2 single crystals via a high-vacuum molecular beam epitaxy process. The present study based on epitaxial growth provides a guide for probing the grain boundaries of various 2D materials and implements higher potentials for the next-generation electronic devices.