• 文献标题:   Surface morphology and characterization of thin graphene films on SiC vicinal substrate
  • 文献类型:   Article
  • 作  者:   PENUELAS J, OUERGHI A, LUCOT D, DAVID C, GIERAK J, ESTRADESZWARCKOPF H, ANDREAZZAVIGNOLLE C
  • 作者关键词:   annealing, atomic force microscopy, carbon, nanostructured material, surface morphology, thin film, xray photoelectron spectra
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   1098-0121
  • 通讯作者地址:   Univ Orleans
  • 被引频次:   59
  • DOI:   10.1103/PhysRevB.79.033408
  • 出版年:   2009

▎ 摘  要

In this Brief Report we present a study of a 6H-SiC(0001) vicinal substrate annealed at various temperatures under ultrahigh vacuum. By combining x-ray photoelectron spectroscopy and atomic force microscopy, we investigated the morphology and the chemical surface changes accompanying the formation of graphene sheets. After annealing at 1100 degrees C step/terrace structures of the SiC substrate are clearly identified and a terrace widening is observed due to step bunching up. At 1300 degrees C approximately two graphene layers are formed and the surface steps completely disappear.