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  • 文献标题:   Rapid, substrate-independent thickness determination of large area graphene layers
  • 文献类型:   Article
  • 作　　者:   VENKATACHALAM DK, PARKINSON P, RUFFELL S, ELLIMAN RG
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Australian Natl Univ
  • 被引频次:   6
  • DOI:   10.1063/1.3664633
  • 出版年:   2011

▎ 摘　　要

Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying graphene films, providing quantitative analysis of large area samples with an optical thickness resolution of ]