▎ 摘　　要

In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible.