▎ 摘　　要

We report a non-contact method for conductivity and sheet resistance measurements of monolayer and few layers graphene samples using a high Q microwave dielectric resonator perturbation technique, with the aim of fast and accurate measurement. The dynamic range of the microwave conductivity measurements makes this technique sensitive to a range of imperfections and impurities and can provide rapid non-contacting characterisation. As a demonstration of the power of the technique, we present results for graphene samples grown by three different methods with widely differing sheet resistance values.