• 文献标题:   Comparison Between Graphene Oxides Reduced by Microwave System with Different Power Sets
  • 文献类型:   Article
  • 作  者:   MARTINS ALBS, DA SILVA EF, MARQUES MFV, PINHEIRO WA
  • 作者关键词:   graphene oxide, microwave reduction, xray diffraction, ftir
  • 出版物名称:   MATERIALS RESEARCHIBEROAMERICAN JOURNAL OF MATERIALS
  • ISSN:   1516-1439 EI 1980-5373
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.1590/1980-5373-MR-2022-0140
  • 出版年:   2022

▎ 摘  要

The present work compares graphene oxides produced by the Marcano's method and the subsequent reduction process using a microwave system with different power and time sets. The thermal profiles of the reduction processes were analyzed, emphasizing the heat capacity from the 600 W test of 3.44 kJ/K. The X-ray diffraction showed a reduction in the interlayer space and the number of layers in all powers. The infrared and UV-Vis spectroscopy results showed a clear decrease in the bands corresponding to the oxygenated group and partial restoration of aromatic bonds. The Raman spectroscopy showed that the 1000 W power set originated a higher defective structure. The observed results allow the conclusion that the 600 W power promotes a little better result between the analyzed power sets.