• 文献标题:   Epitaxial Graphene on 4H-SiC(0001) Grown under Nitrogen Flux: Evidence of Low Nitrogen Doping and High Charge Transfer
  • 文献类型:   Article
  • 作  者:   VELEZFORT E, MATHIEU C, PALLECCHI E, PIGNEUR M, SILLY MG, BELKHOU R, MARANGOLO M, SHUKLA A, SIROTTI F, OUERGHI A
  • 作者关键词:   epitaxial graphene, spectroscopy, nitrogendoped, lowenergy electron microscopy, electronic propertie
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851
  • 通讯作者地址:   CNRS
  • 被引频次:   69
  • DOI:   10.1021/nn304315z
  • 出版年:   2012

▎ 摘  要

Nitrogen doping of graphene is of great interest for both fundamental research to explore the effect of dopants on a 2D electrical conductor and applications such as lithium storage, composites, and nanoelectronic devices. Here, we report on the modifications of the electronic properties of epitaxial graphene thanks to the introduction, during the growth, of nitrogen-atom substitution in the carbon honeycomb lattice. High-resolution transmission microscopy and low-energy electron microscopy investigations indicate that the nitrogen-doped graphene is uniform at large scale. The substitution of nitrogen atoms in the graphene planes was confirmed by high-resolution X-ray photoelectron spectroscopy, which reveals several atomic configurations for the nitrogen atoms: graphitic-like, pyridine-like, and pyrrolic-like. Angle-resolved photoemission measurements show that the N-doped graphene exhibits large n-type carrier concentrations of 2.6 x 10(13) cm(-1), about 4 times more than what is found for pristine graphene, grown under similar pressure conditions. Our experiments demonstrate that a small amount of dopants (<1%) can significantly tune the electronic properties of graphene by shifting the Dirac cone about 0.3 eV toward higher binding energies with respect to their band of pristine graphene, which is a key feature for envisioning applications in nanoelectronics.