• 文献标题:   Tomography of a Probe Potential Using Atomic Sensors on Graphene
  • 文献类型:   Article
  • 作  者:   WYRICK J, NATTERER FD, ZHAO Y, WATANABE K, TANIGUCHI T, CULLEN WG, ZHITENEV NB, STROSCIO JA
  • 作者关键词:   stm, graphene, cobalt, atomic manipulation, defect charging, probe potential, tipinduced band bending, screening
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   NIST
  • 被引频次:   4
  • DOI:   10.1021/acsnano.6b05823
  • 出版年:   2016

▎ 摘  要

Our ability to access and explore the quantum world has been greatly advanced by the power of atomic manipulation and local spectroscopy with scanning tunneling and atomic force microscopes, where the key technique is the use of atomically sharp probe tips to interact with an underlying substrate. Here we employ atomic manipulation to modify and quantify the interaction between the probe and the system under study that can strongly affect any measurement in low charge density systems, such as graphene. We transfer Co atoms from a graphene surface onto a probe tip to change and control the probe's physical structure, enabling us to modify the induced potential at a graphene surface. We utilize single Co atoms on a graphene field-effect device as atomic scale sensors to quantitatively map the modified potential exerted by the scanning probe over the whole relevant spatial and energy range.