▎ 摘　　要

With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moire patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT. (C) 2014 Elsevier Ltd. All rights reserved.