• 文献标题:   Quasi-Freestanding Graphene on SiC(0001) by Ar-Mediated Intercalation of Antimony: A Route Toward Intercalation of High-Vapor-Pressure Elements
  • 文献类型:   Article
  • 作  者:   WOLFF S, ROSCHER S, TIMMERMANN F, DANIEL MV, SPECK F, WANKE M, ALBRECHT M, SEYLLER T
  • 作者关键词:   angleresolved photoelectron spectroscopy, antimony, buffer layer, epitaxial graphene, intercalation, silicon carbide, xray photoelectron spectroscopy
  • 出版物名称:   ANNALEN DER PHYSIK
  • ISSN:   0003-3804 EI 1521-3889
  • 通讯作者地址:   TU Chemnitz
  • 被引频次:   4
  • DOI:   10.1002/andp.201900199 EA AUG 2019
  • 出版年:   2019

▎ 摘  要

A novel strategy for the intercalation of antimony (Sb) under the (63x63)R30 degrees reconstruction, also known as buffer layer, on SiC(0001) is reported. Using X-ray photoelectron spectroscopy, low-energy electron diffraction, and angle-resolved photoelectron spectroscopy, it is demonstrated that, while the intercalation of the volatile Sb is not possible by annealing the Sb-coated buffer layer in ultrahigh vacuum, it can be achieved by annealing the sample in an atmosphere of Ar, which suppresses Sb desorption. The intercalation leads to a decoupling of the buffer layer from the SiC(0001) surface and the formation of quasi-freestanding graphene. The intercalation process paves the way for future studies of the formation of quasi-freestanding graphene by intercalation of high-vapor-pressure elements, which are not accessible by previously known intercalation techniques, and thus provides new avenues for the manipulation of epitaxial graphene on SiC.