• 文献标题:   Measurement of the gauge factor of few-layer graphene
  • 文献类型:   Article
  • 作  者:   ZHENG XH, CHEN X, KIM JK, LEE DW, LI XX
  • 作者关键词:   graphene sheet, few layer, gauge factor, equivalent stress beam
  • 出版物名称:   JOURNAL OF MICRONANOLITHOGRAPHY MEMS MOEMS
  • ISSN:   1932-5150 EI 1932-5134
  • 通讯作者地址:   Huaiyin Inst Technol
  • 被引频次:   12
  • DOI:   10.1117/1.JMM.12.1.013009
  • 出版年:   2013

▎ 摘  要

Graphene, one of the recently discovered carbon nanostructures, has shown good piezoresistive properties. One of the most important areas of research for graphene sheets, in terms of basic science and application in strain or stress sensors, is the measurement of gauge factors. The gauge factors of various layers of graphene sheets are measured based on the equivalent stress beam. The measurement is carried out using a beam-bending method to detect the change in resistance of graphene sheets in different bending states. The gauge factor ranges from 10 to 15, depending on the number of layers in the graphene sheet. These results reveal the piezoresistance effect of single-and multi-layer graphene sheets, which will be of benefit in the fabrication of microsensors. The resistance of graphene sheets decreases as temperature increases from 20 degrees C to 60 degrees C, and the gauge factor is not very sensitive to changes in environmental temperature. (C) 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) [DOI: 10.1117/1.JMM.12.1.013009]