• 文献标题:   Ultralow contact resistivity in annealed titanium edge contacts for multilayered graphene
  • 文献类型:   Article
  • 作  者:   ITO K, OGATA T, SAKAI T, AWANO Y
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS EXPRESS
  • ISSN:   1882-0778 EI 1882-0786
  • 通讯作者地址:   Keio Univ
  • 被引频次:   8
  • DOI:   10.7567/APEX.8.025101
  • 出版年:   2015

▎ 摘  要

The structure dependence and electrical properties of a metal contact with multilayered graphene (MLG) have been investigated. We demonstrate the superiority of end- (or edge-) contact configurations for future three-dimensional (3D) interconnect applications. The contact resistivity of titanium end contacts can be lowered to 7.7 x 10(-8) Omega cm(2) by thermal annealing at 450 degrees C, which is 2 orders of magnitude lower than that of conventional top-contact configurations, and to the best of our knowledge, it is the lowest value ever reported for a pristine MLG. X-ray photoelectron spectroscopy (XPS) measurements revealed the formation of covalent-bonded titanium carbide as an interface layer between the metal layer and MLG. (C) 2015 The Japan Society of Applied Physics