• 文献标题:   Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit
  • 文献类型:   Article
  • 作  者:   PELLEGRINO FMD, FALCI G, PALADINO E
  • 作者关键词:  
  • 出版物名称:   EUROPEAN PHYSICAL JOURNALSPECIAL TOPICS
  • ISSN:   1951-6355 EI 1951-6401
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.1140/epjs/s11734-021-00071-7 EA APR 2021
  • 出版年:   2021

▎ 摘  要

We investigate critical current noise in short ballistic graphene Josephson junctions in the opencircuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence T-3, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.