• 文献标题:   In Situ Imaging of Layer-by-Layer Sublimation of Suspended Graphene
  • 文献类型:   Article
  • 作  者:   HUANG JY, QI L, LI J
  • 作者关键词:   graphene, sublimation, in situ electron microscopy, vacancy hole, bilayer edge
  • 出版物名称:   NANO RESEARCH
  • ISSN:   1998-0124
  • 通讯作者地址:   Sandia Natl Labs
  • 被引频次:   33
  • DOI:   10.1007/s12274-010-1006-4
  • 出版年:   2010

▎ 摘  要

An individual suspended graphene sheet was connected to a scanning tunneling microscopy probe inside a transmission electron microscope, and Joule heated to high temperatures. At high temperatures and under electron beam irradiation, the few-layer graphene sheets were removed layer-by-layer in the viewing area until a monolayer graphene was formed. The layer-by-layer peeling was initiated at vacancies in individual graphene layers. The vacancies expanded to form nanometer-sized holes, which then grew along the perimeter and propagated to both the top and bottom layers of a bilayer graphene joined by a bilayer edge. The layer-by-layer peeling was induced by atom sublimation caused by Joule heating and facilitated by atom displacement caused by high-energy electron irradiation, and may be harnessed to control the layer thickness of graphene for device applications.