• 文献标题:   Minimizing electrode edge in organic transistors with ultrathin reduced graphene oxide for improving charge injection efficiency
  • 文献类型:   Article
  • 作  者:   XU ZY, CHEN XS, ZHANG SN, WU KJ, LI HW, MENG YC, LI LQ
  • 作者关键词:  
  • 出版物名称:   PHYSICAL CHEMISTRY CHEMICAL PHYSICS
  • ISSN:   1463-9076 EI 1463-9084
  • 通讯作者地址:   Chinese Acad Sci
  • 被引频次:   8
  • DOI:   10.1039/c6cp00756b
  • 出版年:   2016

▎ 摘  要

Electrode materials and geometry play a crucial role in the charge injection efficiency in organic transistors. Reduced graphene oxide (RGO) electrodes show good compatibility with an organic semiconductor from the standpoint of energy levels and ordered growth of the organic semiconductor, both of which are favourable for charge injection. However, the wide electrode edge (>10 nm) in commonly-used RGO electrodes is generally detrimental to charge injection. In this study, ultrathin (about 3 nm) RGO electrodes are fabricated via a covalency-based assembly strategy, which has advantages such as robustness against solvents, high conductivity, transparency, and easy scaling-up. More remarkably, the ultrathin electrode fabricated in this study has a narrow edge, which may facilitate the diffusion and assembly of organic semiconductors and thus form a uniform semiconductor film across the electrode/channel junction area. As a result, the minimized electrode edge may significantly improve the charge injection in organic transistors compared with thick electrodes.