• 文献标题:   Impedance spectroscopy analysis of the switching mechanism of reduced graphene oxide resistive switching memory
  • 文献类型:   Article
  • 作  者:   HO NT, SENTHILKUMAR V, KIM YS
  • 作者关键词:   resistive switching memory, graphene oxide, thermally reduced graphene oxide, impedance spectroscopy
  • 出版物名称:   SOLIDSTATE ELECTRONICS
  • ISSN:   0038-1101 EI 1879-2405
  • 通讯作者地址:   Univ Ulsan
  • 被引频次:   13
  • DOI:   10.1016/j.sse.2014.02.002
  • 出版年:   2014

▎ 摘  要

In this study, we investigated the resistive switching behavior of pristine graphene oxide and thermally reduced GO. Impedance spectroscopy and current-voltage analysis were used to verify the possible physical mechanism of the switching operation. Our observations demonstrated that, the switching operation originates from the oxidation/reduction at the top interface of Al electrode and oxygen migration inside the active layer. Reversible redox reaction Al+1 + xO (2) <-> AlOx is ground for the conduction electrons. (C) 2014 Elsevier Ltd. All rights reserved.