▎ 摘　　要

Engineering of defects located in grains or at grain boundaries is central to the development of functional materials. Although there is a surge of interest in the formation, migration and annihilation of defects during ion and plasma irradiation of bulk materials, these processes are rarely assessed in low-dimensional materials and remain mostly unexplored spectroscopically at the micrometre scale due to experimental limitations. Here, we use a hyperspectral Raman imaging scheme providing high selectivity and diffraction-limited spatial resolution to examine plasma-induced damage in a polycrystalline graphene film. Measurements conducted before and after very low-energy (11-13 eV) ion bombardment show defect generation in graphene grains following a zero-dimensional defect curve, whereas domain boundaries tend to develop as one-dimensional defects. Damage generation is slower at grain boundaries than within the grains, a behaviour ascribed to preferential self-healing. This evidence of local defect migration and structural recovery in graphene sheds light on the complexity of chemical and physical processes at the grain boundaries of two-dimensional materials. Hyperspectral Raman imaging is used to visualize defects in polycrystalline graphene under ion bombardment, showing zero-dimensional and one-dimensional defects in grains and at grain boundaries, respectively, and preferential self-healing at the grain boundaries.