• 文献标题:   In situ study on the electronic structure of graphene grown on 6H-SiC (0 0 0 (1)over-bar) with synchrotron radiation photoelectron spectroscopy
  • 文献类型:   Article
  • 作  者:   KANG CY, TANG J, LI LM, PAN HB, XU PS, WEI SQ, CHEN XF, XU XG
  • 作者关键词:   synchrotron radiation photoelectron, spectroscopy, 6hsic, graphene, electronic propertie
  • 出版物名称:   APPLIED SURFACE SCIENCE
  • ISSN:   0169-4332 EI 1873-5584
  • 通讯作者地址:   Univ Sci Technol China
  • 被引频次:   3
  • DOI:   10.1016/j.apsusc.2011.02.068
  • 出版年:   2012

▎ 摘  要

Low energy electron diffraction (LEED) and synchrotron radiation photoelectron spectroscopy (SRPES) were used to study the synthesis process and detailed electronic structures of graphene produced by thermal decomposition of 6H-SiC (0 0 0 (1) over bar) in ultrahigh vacuum (UHV). The LEED results showed that as annealing temperature increased, different reconstructions of 6H-SiC (0 0 0 (1) over bar) appeared and the anisotropic graphene layers were produced finally. The results of C 1s core levels indicated that the component, which was assigned to graphene emerged and the interface interaction between graphene and the substrate was weak. The existence of Si clusters was confirmed by Si 2p core levels and perhaps these clusters led to rough epitaxial graphene surface. The results of valence band spectra showed that at high annealing temperature both of sigma and pi bonds existed in the grown graphene layers. Crown Copyright (C) 2011 Published by Elsevier B.V. All rights reserved.