• 文献标题:   Gate dependent photocurrents at a graphene p-n junction
  • 文献类型:   Article
  • 作  者:   PETERS EC, LEE EJH, BURGHARD M, KERN K
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Max Planck Inst Festkorperforsch
  • 被引频次:   89
  • DOI:   10.1063/1.3505926
  • 出版年:   2010

▎ 摘  要

We have used scanning photocurrent microscopy to explore the electronic characteristics of a graphene p-n junction fabricated by local chemical doping of a graphene sheet. The photocurrent signal at the junction was found to be most prominent for gate voltages between the two Dirac points of the oppositely doped graphene regions. The gate dependence of this signal agrees well with simulations based upon the Fermi level difference between the two differently doped sections. It is concluded that the photocurrent maps are dominated by the built-in electric field, with only a minor photothermoelectric contribution. (C) 2010 American Institute of Physics. [doi:10.1063/1.3505926]