• 文献标题:   Growth and low-energy electron microscopy characterizations of graphene and hexagonal boron nitride
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   HIBINO H, WANG S, OROFEO CM, KAGESHIMA H
  • 作者关键词:   graphene, hexagonal boron nitride, twodimensional material, lowenergy electron microscopy, chemical vapor deposition
  • 出版物名称:   PROGRESS IN CRYSTAL GROWTH CHARACTERIZATION OF MATERIALS
  • ISSN:   0960-8974
  • 通讯作者地址:   Kwansei Gakuin Univ
  • 被引频次:   10
  • DOI:   10.1016/j.pcrysgrow.2016.04.008
  • 出版年:   2016

▎ 摘  要

Graphene and related two-dimensional (2D) materials are attracting huge attention due to their wide-range potential applications. Because large-scale, high-quality 2D crystals are prerequisites for many of the applications, crystal growth of 2D materials has been intensively studied. We have also been conducting research to understand the growth mechanism of 2D materials and have been developing growth techniques of high-quality materials based on the understandings, in which detailed structural characterizations using low-energy electron microscopy (LEEM) have played essential roles. In this paper, we explain the principles of obtaining various structural features using LEEM, and then we review the status of our current understanding on the growth of graphene and hexagonal boron nitride. (C) 2016 Elsevier Ltd. All rights reserved.