• 文献标题:   Recent Progress in Using Graphene as an Ultrathin Transparent Support for Transmission Electron Microscopy
  • 文献类型:   Review
  • 作  者:   SINHA S, WARNER JH
  • 作者关键词:   2d material, electron transparent support, graphene, transmission electron microscopy
  • 出版物名称:   SMALL STRUCTURES
  • ISSN:  
  • 通讯作者地址:  
  • 被引频次:   14
  • DOI:   10.1002/sstr.202000049
  • 出版年:   2021

▎ 摘  要

Transmission electron microscopy (TEM) has long been used as the ultimate characterization technique for nanomaterials at the atomic level. Herein, the importance of the use of graphene in TEM is also presented to introduce the properties that make it indispensable for the characterization of other nanomaterials and study their properties and van der Waals interactions. A broad overview of the importance of using TEM for the study of nanomaterials and the rise of graphene as a superior substrate for the study of different kinds of low-dimensional materials is provided. A review of the study of morphology, properties, and behavior of a range of nanomaterials is presented, with a specific focus on how graphene facilitates these studies due to its unique influence and interaction with the specific materials under TEM. This review presents an overview of the various studies and characterization that have been carried out on a range of nanomaterials using TEM with the use of graphene, and discusses the future challenges and engineering applications.