• 文献标题:   Visualization of defect densities in reduced graphene oxide
  • 文献类型:   Article
  • 作  者:   EIGLER S, DOTZER C, HIRSCH A
  • 作者关键词:  
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:   Univ Erlangen Nurnberg
  • 被引频次:   230
  • DOI:   10.1016/j.carbon.2012.03.039
  • 出版年:   2012

▎ 摘  要

Efficiently reducible graphene oxide (GO) was obtained, even if a high degree of functionalization is present. Graphite with few defects was used as starting material and oxidized according to Hummer's method. An extremely high I-D/I-G ratio for rGO of 2.8 (532 nm) was observed in the Raman spectrum as a consequence of the lower defect density in GO. It was also possible to demonstrate the impact of local defects on the structure in rGO by local laser exposure experiments on single graphene oxide flakes. Raman spectroscopy can visualize the laser impact by I-D/I-G ratio measurements. (C) 2012 Elsevier Ltd. All rights reserved.