• 文献标题:   Barrier Height at the Graphene and Carbon Nanotube Junction
  • 文献类型:   Article
  • 作  者:   KIM TG, KIM UJ, LEE SY, LEE YH, YU YS, HWANG SW, KIM S
  • 作者关键词:   barrier height, carbon nanotube cnt, fet, graphene, spice
  • 出版物名称:   IEEE TRANSACTIONS ON ELECTRON DEVICES
  • ISSN:   0018-9383 EI 1557-9646
  • 通讯作者地址:   Samsung Adv Inst Technol
  • 被引频次:   8
  • DOI:   10.1109/TED.2014.2317799
  • 出版年:   2014

▎ 摘  要

Graphene/carbon nanotube (CNT) junction barrier height was investigated using all-carbon field-effect transistor structure with graphene and single-walled CNT (SWCNT) network as source (S)/drain (D)/gate electrodes and as channel, respectively. SWCNT network channel was formed by dielectricphoresis process at the prepatterned graphene S/D electrodes. By analyzing the measured current-voltage characteristics by the diode circuit model, the Schottky barrier height at the graphene and CNT junction was found to be approximately 0.5 eV.