• 文献标题:   Robust sandwiched fluorinated graphene for highly reliable flexible electronics
  • 文献类型:   Article
  • 作  者:   SAHOO M, WANG JC, NISHINA Y, LIU ZW, BOW JS, LAI CS
  • 作者关键词:   cvd graphene, sandwiched fluorinated graphene, flexible transparent, field effect transistor, bending, strain
  • 出版物名称:   APPLIED SURFACE SCIENCE
  • ISSN:   0169-4332 EI 1873-5584
  • 通讯作者地址:   Chang Gung Univ
  • 被引频次:   6
  • DOI:   10.1016/j.apsusc.2019.143839
  • 出版年:   2020

▎ 摘  要

The high sensitivity of graphene to the surface condition of the gate dielectric layer and its poor van der Waals adhesion with a flexible substrate result in interfacial sliding and fracturing of graphene at low strains, making the successful utilization of pristine graphene (PG) in flexible electronics challenging. Here, we report a facile method for the fabrication of flexible graphene field effect transistors (F-GFETs) using sandwiched fluorinated graphene (FG). The "FG-PG-FG" sandwich structure shows a high optical transparency (> 94%) with an average carrier mobility above 340 cm(2)/V.s, higher than that obtained when GO and Ion gel were used as gate dielectric materials on F-GFETs and a relatively low gate leakage current of similar to 160 pA. Furthermore, we observed a high mechanical stability, retaining > 88% of the original current output against bending deformation of up to 6 mm and > 77% after 200 bending cycles by applying a tensile strain of 1.56%, compared to the control sample. This improved performance is attributed to the fact that the sandwiched FG provides a good dielectric environment by tuning the C/F ratio, which tightly fixes the PG under strain. These findings provide a new route for the future development of graphene-based flexible electronics.