• 文献标题:   Wafer bonding solution to epitaxial graphene-silicon integration
  • 文献类型:   Article
  • 作  者:   DONG R, GUO ZL, PALMER J, HU YK, RUAN M, HANKINSON J, KUNC J, BHATTACHARYA SK, BERGER C, DE HEER WA
  • 作者关键词:   epitaxial graphene, silicononinsulator, graphenesilicon integration, nanoelectronic
  • 出版物名称:   JOURNAL OF PHYSICS DAPPLIED PHYSICS
  • ISSN:   0022-3727 EI 1361-6463
  • 通讯作者地址:   Georgia Inst Technol
  • 被引频次:   12
  • DOI:   10.1088/0022-3727/47/9/094001
  • 出版年:   2014

▎ 摘  要

A new strategy for the integration of graphene electronics with silicon complementary metal-oxide-semiconductor (Si-CMOS) technology is demonstrated that requires neither graphene transfer nor patterning. Inspired by silicon-on-insulator and three-dimensional device hyper-integration techniques, a thin monocrystalline silicon layer ready for CMOS processing is bonded to epitaxial graphene (EG) on SiC. The parallel Si and graphene electronic platforms are interconnected by metal vias. In this method, EG is grown prior to bonding so that the process is compatible with EG high temperature growth and preserves graphene integrity and nano-structuring.