• 文献标题:   Vertical Graphene Tunneling Heterostructure with Ultrathin Ferroelectric BaTiO3 Film as a Tunnel Barrier
  • 文献类型:   Article
  • 作  者:   CHAN HL, YUAN SG, HAO JH
  • 作者关键词:   ferroelectric tunnel junction, graphenebased device, pulsed laser deposition, tunneling electroresistance effect, twodimensional material
  • 出版物名称:   PHYSICA STATUS SOLIDIRAPID RESEARCH LETTERS
  • ISSN:   1862-6254 EI 1862-6270
  • 通讯作者地址:   Hong Kong Polytech Univ
  • 被引频次:   0
  • DOI:   10.1002/pssr.201800205
  • 出版年:   2018

▎ 摘  要

Ferroelectric tunnel junctions (FTJs) have attracted enormous interests as one of the promising candidates for next-generation non-volatile resistance memories. In this work, we report a novel FTJ employing both two-dimensional material and semiconductor electrode, in the graphene/BaTiO3/Nb:SrTiO3 heterostructure, yielding an interesting tunneling electroresistance (TER) effect. We investigate the TER dependence on Nb doping concentrations from 0.1 to 1.0wt% in the semiconductor electrode. In addition to modulating barrier height by ferroelectric polarization reversal, the ON/OFF resistance ratio can be tuned by adjusting Nb doping concentrations due to further modulation of barrier width. An optimized ON/OFF ratio above 10(3) of the device is observed when introducing 0.1wt% Nb concentration at room temperature. Furthermore, good retention property and switching reproducibility can be achieved in the devices. The results provide a novel pathway to design the graphene-based FTJ at the nanoscale, which is useful for developing non-volatile memory devices with enhanced performance.