• 文献标题:   High-Performance Inkjet-Printed Indium-Gallium-Zinc-Oxide Transistors Enabled by Embedded, Chemically Stable Graphene Electrodes
  • 文献类型:   Article
  • 作  者:   SECOR EB, SMITH J, MARKS TJ, HERSAM MC
  • 作者关键词:   amorphous oxide semiconductor, inkjet printing graphene, printed electronic, thinfilm transistor, stability
  • 出版物名称:   ACS APPLIED MATERIALS INTERFACES
  • ISSN:   1944-8244
  • 通讯作者地址:   Northwestern Univ
  • 被引频次:   36
  • DOI:   10.1021/acsami.6b02730
  • 出版年:   2016

▎ 摘  要

Recent developments in solution-processed amorphous oxide semiconductors have established indium-gallium-zinc-oxide (IGZO) as a promising candidate for printed electronics. A key challenge for this-vision is the integration of IGZO thin-film transistor (TFT) channels with compatible source/drain electrodes using low-temperature, solution -phase patterning methods. Here we demonstrate the suitability of inkjet-printed graphene electrodes for this purpose. In contrast to common inkjet-printed silver -based conductive inks, graphene provides a chemically stable electrode -channel interface. Furthermore, by embedding the graphene electrode between two consecutive IGZO printing passes, high-performance IGZO TFTs are achieved with an electron mobility of similar to 6c m(2)/V.s and current on/off ratio of similar to 10(5). The resulting printed devices exhibit robust stability to aging in ambient as well as excellent resilience to thermal stress, thereby offering a promising platform for future printed electronics applications.