▎ 摘　　要

Freestanding graphene displays an outstanding resilience to electron irradiation at low electron energies. Point defects in graphene are, however, subject to beam driven dynamics. This means that high resolution micrographs of point defects, which usually require a high electron irradiation dose might not represent the intrinsic defect population. Here, we capture the initial defects formed by ejecting carbon atoms under electron irradiation, by imaging with very low doses and subsequent reconstruction of the frequently occuring defects via a maximum likelihood algorithm.