▎ 摘　　要

The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (L-sigma) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of L-sigma (4.2 +/- 0.5 nm). The current near-field measurements verify the theoretical value of L-sigma and highlight the potential of TERS in characterizing graphene at the nanoscale. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.