• 文献标题:   Enhanced thermoelectric performance of defect engineered monolayer graphene
  • 文献类型:   Article
  • 作  者:   KIM W, LEE W, LEE SM, KIM D, PARK J
  • 作者关键词:   graphene, defect engineering, thermoelectric figure of merit, thermoelectric property measurement
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.1088/1361-6528/ac4aa6
  • 出版年:   2022

▎ 摘  要

We propose a method of improving the thermoelectric properties of graphene using defect engineering through plasma irradiation and atomic layer deposition (ALD). We intentionally created atomic blemishes in graphene by oxygen plasma treatment and subsequently healed the atomistically defective places using Pt-ALD. After healing, the thermal conductivity of the initially defective graphene increased slightly, while the electrical conductivity and the square of the Seebeck coefficient increased pronouncedly. The thermoelectric figure of merit of the Pt-ALD treated graphene was measured to be over 4.8 times higher than the values reported in the literature. We expect that our study could provide a useful guideline for the development of graphene-based thermoelectric devices.