▎ 摘　　要

An eccentric sol-gel method was used to synthesize the graphene oxide, reduced graphene oxide, Bi2O3 and graphene-doped Bi2O3. The samples were subjected to X-ray diffraction for the structural analysis. The structural parameters of all the samples were estimated and various strains like lattice strain, RMS strain, etc. and densities like X-ray density, dislocation and screw density were also calculated. Modified Scherrer method and W-H plot method are also used to estimate the average crystallite size and the intrinsic strain of all the synthesized materials.