• 文献标题:   Ellipsometry of graphene on a substrate
  • 文献类型:   Article
  • 作  者:   MEERA V, SETLUR GS
  • 作者关键词:   elemental semiconductor, graphene, maxwell equation, monolayer, narrow band gap semiconductor, optical conductivity, reflectivity, semiconductor thin film, tensor
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0148-6055 EI 1520-8516
  • 通讯作者地址:   Indian Inst Technol Guwahati
  • 被引频次:   7
  • DOI:   10.1063/1.3295913
  • 出版年:   2010

▎ 摘  要

Monolayer graphene deposited on a dielectric substrate material is investigated theoretically using Maxwell's equations to study its optical properties. Optical quantities such as reflected polarization and reflection coefficient are important since they are able to provide information about the conductivity tensor of the graphene layer. This study can be considered as a general one which gives the suspended graphene as its limiting case. The focus of this study is the effect of substrate on graphene (suspended) optical properties for which a comparison between the suspended graphene and graphene on substrate is made here at each stage. An investigation of the reflection coefficient reveals the presence of Brewster's-like phenomena which is not observable in suspended graphene.