• 文献标题:   Self-Assembly of Janus Graphene Oxide via Chemical Breakdown for Scalable High-Performance Memristors
  • 文献类型:   Article, Early Access
  • 作  者:   HUI F, ZHANG CH, YU HH, HAN TT, WEBER J, SHEN YQ, XIAO YP, LI XH, ZHANG ZJ, LIU PS
  • 作者关键词:   janus 2d material, memristor, scalable fabrication, solidstate microelectronic, threshold resistive switching
  • 出版物名称:   ADVANCED FUNCTIONAL MATERIALS
  • ISSN:   1616-301X EI 1616-3028
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.1002/adfm.202302073 EA MAY 2023
  • 出版年:   2023

▎ 摘  要

Janus 2D materials have drawn substantial attention recently owing to its extraordinary interface properties and promising applications in optoelectronic devices. However, the scalable fabrication of high-quality Janus 2D materials is still one of the main obstacles to hinder its implementation in the industry. Herein, a new method (called "chemical breakdown") is developed to obtain large-area uniform Janus graphene oxide (J-GO) films with high-quality. Moreover, the first application of J-GO in the field of memristive devices is presented for neuromorphic computing. In particular, crossbar arrays of Ag/J-GO/Au memristive devices that exhibit threshold resistive switching (RS) with enhanced performance are fabricated, e.g., low leakage current (approximate to 10(-12) A), low operation voltage (approximate to 0.3 V), high endurance (>12,000 cycles), and electro-synaptic plasticity. This work provides a novel strategy to obtain large-area, continuous and uniform Janus 2D films, and proposes a new application for Janus 2D materials in a hot topic (i.e., neuromorphic computing) within the field of solid-state microelectronics.