• 文献标题:   Ultra-low resistance ohmic contacts in graphene field effect transistors
  • 文献类型:   Article
  • 作  者:   MOON JS, ANTCLIFFE M, SEO HC, CURTIS D, LIN S, SCHMITZ A, MILOSAVLJEVIC I, KISELEV AA, ROSS RS, GASKILL DK, CAMPBELL PM, FITCH RC, LEE KM, ASBECK P
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   HRL Labs LLC
  • 被引频次:   90
  • DOI:   10.1063/1.4719579
  • 出版年:   2012

▎ 摘  要

We report on an experimental demonstration of graphene-metal ohmic contacts with contact resistance below 100 Omega mu m. These have been fabricated on graphene wafers, both with and without hydrogen intercalation, and measured using the transmission line method. Specific contact resistivities of 3 x 10(-7) to 1.2 x 10(-8) Omega cm(2) have been obtained. The ultra-low contact resistance yielded short-channel (source-drain distance of 0.45 mu m) HfO2/graphene field effect transistors (FETs) with a low on-resistance (R-on) of 550 Omega mu m and a high current density of 1.7 A/mm at a source-drain voltage of 1V. These values represent state-of-the-art (SOA) performance in graphene-metal contacts and graphene FETs. This ohmic contact resistance is comparable to that of SOA high-speed III-V high electron mobility transistors. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4719579]