• 文献标题:   Room temperature carrier transport in graphene
  • 文献类型:   Article
  • 作  者:   SHISHIR RS, CHEN F, XIA J, TAO NJ, FERRY DK
  • 作者关键词:   graphene, impurity scattering, surface roughness scattering, carrier puddle
  • 出版物名称:   JOURNAL OF COMPUTATIONAL ELECTRONICS
  • ISSN:   1569-8025 EI 1572-8137
  • 通讯作者地址:   Arizona State Univ
  • 被引频次:   38
  • DOI:   10.1007/s10825-009-0278-y
  • 出版年:   2009

▎ 摘  要

Graphene is a novel new material with an unusual zero-gap band structure, where electrons and holes are closely connected through a relativistic Dirac equation. It is of interest to study the various scattering mechanisms and the transport through device structures fabricated on this new material. Here, we use Rode's method to study the transport through gated graphene devices. The results are compared with recent results obtained for both back-gates and electrochemical gates. The transport is dominated by the trapped charge at the graphene-SiO2, but phonon scattering is shown to be important.