• 文献标题:   In Situ Synthesis and Nonvolatile Rewritable-Memory Effect of Polyaniline-Functionalized Graphene Oxide
  • 文献类型:   Article
  • 作  者:   ZHANG B, CHEN Y, REN YJ, XU LQ, LIU G, KANG ET, WANG C, ZHU CX, NEOH KG
  • 作者关键词:   density functional calculation, electronic structure, graphene, rewritablememory effect, synthetic method
  • 出版物名称:   CHEMISTRYA EUROPEAN JOURNAL
  • ISSN:   0947-6539 EI 1521-3765
  • 通讯作者地址:   E China Univ Sci Technol
  • 被引频次:   41
  • DOI:   10.1002/chem.201203940
  • 出版年:   2013

▎ 摘  要

A new polyaniline (PANI)-functionalized graphene oxide (GO-PANI) was prepared by using an in situ oxidative graft polymerization of aniline on the surface of GO. Its highest occupied molecular orbital (HOMO), lowest unoccupied molecular orbital (LUMO), ionization potential (IP), and electron affinity (EA) values experimentally estimated by the onset of the redox potentials were 5.33, 3.57, 5.59, and 3.83eV, respectively. A bistable electrical-switching effect was observed in electronic device with the GO-PANI film sandwiched between the indium tin oxide (ITO) and Al electrodes. This device exhibited two accessible conductivity states, that is, the low-conductivity (OFF) state and the high-conductivity (ON) state, and can be switched to the ON state under a negative electrical sweep, and can also be reset to the initial OFF state by a reverse (positive) electrical sweep. The ON state is nonvolatile and can withstand a constant voltage stress of 1V for 3h and 108 read cycles at 1V under ambient conditions. The nonvolatile nature of the ON state and the ability to write, read, and erase the electrical states, fulfill the functionality of a rewritable memory. An ON/OFF current ratio of more than 104 at 1V achieved in this memory device is high enough to promise a low misreading rate through the precise control of the ON and OFF states. The mechanism associated with the memory effects was elucidated from molecular simulation results.