• 文献标题:   Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy
  • 文献类型:   Article
  • 作  者:   EREN B, GYSIN U, MAROT L, GLATZEL T, STEINER R, MEYER E
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Basel
  • 被引频次:   2
  • DOI:   10.1063/1.4940891
  • 出版年:   2016

▎ 摘  要

Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.