• 文献标题:   Large-area thin-film capacitors deposited onto graphene bottom electrodes via facing-target sputtering that is free of plasma damage
  • 文献类型:   Article
  • 作  者:   KIM JH, PARK BJ, EOM JH, YOON SG
  • 作者关键词:   bmn thin film capacitor, graphene bottom electrode, onaxis sputtering, fts, dielectric property, leakage current density
  • 出版物名称:   JOURNAL OF ALLOYS COMPOUNDS
  • ISSN:   0925-8388 EI 1873-4669
  • 通讯作者地址:   Chungnam Natl Univ
  • 被引频次:   3
  • DOI:   10.1016/j.jallcom.2016.11.392
  • 出版年:   2017

▎ 摘  要

One hundred nm-thick Bi2Mg2/3Nb4/3O7 (BMN) thin films were deposited onto graphene bottom electrodes at 300 degrees C via on-axis sputtering and facing-target sputtering (FTS) to produce 4 x 4 cm(2) capacitors. The graphene films grown on Ni (250 nm)/Si (001) via rapid-thermal chemical vapor deposition (RTP CVD) were transferred to Ti (10 nm)/SiO2 (250 nm)/Si (001) substrates for removal of the wrinkles and ripples. The on-axis sputtering deteriorated the dielectric and leakage current properties of the BMN capacitors. The FTS method was free of plasma damage, which remarkably enhanced the electrical properties of the BMN/graphene thin-film capacitors. FTS is an attractive method for large-scale thin-film capacitors that use graphene bottom electrodes. (C) 2016 Elsevier B.V. All rights reserved.