• 文献标题:   Large amplitude charge noise and random telegraph fluctuations in room-temperature graphene single-electron transistors
  • 文献类型:   Article
  • 作  者:   FRIED JP, BIAN XY, SWETT JL, KRAVCHENKO II, BRIGGS GAD, MOL JA
  • 作者关键词:  
  • 出版物名称:   NANOSCALE
  • ISSN:   2040-3364 EI 2040-3372
  • 通讯作者地址:   Univ Oxford
  • 被引频次:   0
  • DOI:   10.1039/c9nr08574b
  • 出版年:   2020

▎ 摘  要

We analyze the noise in liquid-gated, room temperature, graphene quantum dots. These devices display extremely large noise amplitudes. The observed noise is explained in terms of a charge noise model by considering fluctuations in the applied source-drain and gate potentials. We show that the liquid environment and substrate have little effect on the observed noise and as such attribute the noise to charge trapping/detrapping at the disordered graphene edges. The trapping/detrapping of individual charges can be tuned by gating the device, which can result in stable two-level fluctuations in the measured current. These results have important implications for the use of electronic graphene nanodevices in single-molecule biosensing.