▎ 摘　　要

We report combined electrochemical double-layer capacitance (EDLC) and pseudocapacitance in reduced graphene oxide (rGO) thick film like paper due to annealing temperature variations. The influence of annealing temperature (from room temperature (RT) to 1000 degrees C) on the structural, morphological, electrical, and electrochemical properties of rGO paper was evaluated. Upon increasing the annealing temperature, shifting of the dominant (002) X-ray diffraction (XRD) peak to a higher degree, volume expansion, and red-shifting of the G band in Raman spectra were observed. High-resolution transmission electron microscopy (HRTEM) images showed a reduction in the interlayer distance in rGO sheets from 0.369 to 0.349 nm as the annealing temperature increased from RT to 1000 degrees C; these results were congruent with the XRD results. According to X-ray photoelectron spectroscopy (XPS), the presence of hydroxyl, carboxyl, and other oxygen-containing groups decreased in samples annealed at higher temperatures. The attached functional groups, the electrical conductivity, and the supercapacitance of rGO papers were found to be mutually interrelated and could be tuned by varying the annealing temperature. The rGO paper annealed at 200 degrees C in a 1 M H2SO4 electrolyte at a scan rate of 50 mV s(-1) exhibited a maximum specific capacitance of 198 F g(-1).