• 文献标题:   Inverted process for graphene integrated circuits fabrication
  • 文献类型:   Article
  • 作  者:   LV HM, WU HQ, LIU JB, HUANG C, LI JF, YU JH, NIU JB, XU QX, YU ZP, QIAN H
  • 作者关键词:  
  • 出版物名称:   NANOSCALE
  • ISSN:   2040-3364 EI 2040-3372
  • 通讯作者地址:   Tsinghua Univ
  • 被引频次:   8
  • DOI:   10.1039/c3nr06904d
  • 出版年:   2014

▎ 摘  要

CMOS compatible 200 mm two-layer-routing technology is employed to fabricate graphene field-effect transistors (GFETs) and monolithic graphene ICs. The process is inverse to traditional Si technology. Passive elements are fabricated in the first metal layer and GFETs are formed with buried gate/source/drain in the second metal layer. Gate dielectric of 3.1 nm in equivalent oxide thickness (EOT) is employed. 500 nm-gate-length GFETs feature a yield of 80% and f(T)/f(max). = 17 GHz/15.2 GHz RF performance. A high-performance monolithic graphene frequency multiplier is demonstrated using the proposed process. Functionality was demonstrated up to 8 GHz input and 16 GHz output. The frequency multiplier features a 3 dB bandwidth of 4 GHz and conversion gain of -26 dB.