• 文献标题:   SiC Homoepitaxy, Etching and Graphene Epitaxial Growth on SiC Substrates Using a Novel Fluorinated Si Precursor Gas (SiF4)
  • 文献类型:   Article
  • 作  者:   RANA T, CHANDRASHEKHAR MVS, DANIELS K, SUDARSHAN T
  • 作者关键词:   silicon carbide, etching, epitaxial growth, graphene, tetrafluorosilane
  • 出版物名称:   JOURNAL OF ELECTRONIC MATERIALS
  • ISSN:   0361-5235 EI 1543-186X
  • 通讯作者地址:   Univ S Carolina
  • 被引频次:   2
  • DOI:   10.1007/s11664-015-4234-2
  • 出版年:   2016

▎ 摘  要

Tetrafluorosilane (SiF4 or TFS), a novel precursor gas, has been demonstrated to perform three primary operations of silicon carbide-related processing: SiC etching, SiC epitaxial growth and graphene epitaxial growth. TFS etches SiC substrate vigorously in a H-2 ambient by efficient Si removal from the surface, where SiC etch rate is a function of TFS gas concentration. In this SiC etching process, Si is removed by TFS and C is removed by H-2. When propane is added to a H-2 and TFS gas mixture, etching is halted and high-quality SiC epitaxy takes place in a Si droplet-free condition. TFS's ability to remove Si can also be exploited to grow epitaxial graphene in a controllable manner in an inert (Ar) ambient. Here, TFS enhances graphene growth by selective etching of Si from the SiC surface.