• 文献标题:   Tunneling characteristics in chemical vapor deposited graphene-hexagonal boron nitride-graphene junctions
  • 文献类型:   Article
  • 作  者:   ROY T, LIU L, DE LA BARRERA S, CHAKRABARTI B, HESABI ZR, JOINER CA, FEENSTRA RM, GU G, VOGEL EM
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Georgia Inst Technol
  • 被引频次:   31
  • DOI:   10.1063/1.4870073
  • 出版年:   2014

▎ 摘  要

Large area chemical vapor deposited graphene and hexagonal boron nitride was used to fabricate graphene-hexagonal boron nitride-graphene symmetric field effect transistors. Gate control of the tunneling characteristics is observed similar to previously reported results for exfoliated graphene-hexagonal boron nitride-graphene devices. Density-of-states features are observed in the tunneling characteristics of the devices, although without large resonant peaks that would arise from lateral momentum conservation. The lack of distinct resonant behavior is attributed to disorder in the devices, and a possible source of the disorder is discussed. (C) 2014 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4870073]