• 文献标题:   X-ray photoelectron study of electrical double layer at graphene/phosphoric acid interface
  • 文献类型:   Article
  • 作  者:   SYSOEV VI, OKOTRUB AV, ARKHIPOV VE, SMIRNOV DA, BULUSHEVA LG
  • 作者关键词:   graphene, fluorinated graphene, phosphoric acid, electrical double layer, xray photoelectron spectroscopy
  • 出版物名称:   APPLIED SURFACE SCIENCE
  • ISSN:   0169-4332 EI 1873-5584
  • 通讯作者地址:   SB RAS
  • 被引频次:   0
  • DOI:   10.1016/j.apsusc.2020.146007
  • 出版年:   2020

▎ 摘  要

Here, we use in situ X-ray photoelectron spectroscopy (XPS) to investigate electrochemical processes at the graphene surface. As a model system, we design a sandwich-type electrochemical cell consisting of working graphene electrode separated from back by a fluorinated graphene (FG) film impregnated with a phosphoric acid electrolyte. Migration of the ions to the graphene electrode under applied potential causes a change of the observed concentration of carbon and phosphorus in the electrochemical cell as compared to the non-charged state. This fact allows revealing the process of electrical double layer formation at the graphene/FG-separator interface. The observed changes in the binding energies of elements composing electrolyte and graphene electrode are related with a shift of the Fermi level due to the charge transfer from the adsorbed ions.