• 文献标题:   Observation of Quantum Hall Effect and weak localization in p-type bilayer epitaxial graphene on SiC(0001)
  • 文献类型:   Article
  • 作  者:   YU C, LI J, GAO KH, LIN T, LIU QB, DUN SB, HE ZZ, CAI SJ, FENG ZH
  • 作者关键词:   graphene, defect, quantum hall effect, weak localization
  • 出版物名称:   SOLID STATE COMMUNICATIONS
  • ISSN:   0038-1098
  • 通讯作者地址:   Hebei Semicond Res Inst
  • 被引频次:   1
  • DOI:   10.1016/j.ssc.2013.04.010
  • 出版年:   2013

▎ 摘  要

We investigated the magnetotransport properties of a bilayer graphene Hall bar sample epitaxially grown on Si-terminated silicon carbide. Integer quantum Hall effect and weak localization effect were observed. From the weak localization effect, the carrier scattering and phase coherence were extracted. The extracted phase coherence length is 0.5 mu m at 2 K, which is comparable with that of the exfoliated graphene. The temperature dependence of the phase coherence rate shows that electron-electron interaction is the main inelastic-scattering factor and direct Coulomb interaction also exists. Compared with exfoliated bilayer graphene, no sign of weak antilocalization was observed at such high carrier concentration of 10(13) cm(-2) due to the strong intervally scattering. Both the strong intervally scattering and Coulomb interaction of phase coherence are due to the large amount of atomically sharp defects in epitaxial graphene on Si-terminated SiC. (C) 2013 Elsevier Ltd. All rights reserved.